Abstract: The present invention proposes methods, devices and computer program products. To this extent, there is defined a set X including N distinct parameter values x_i for at least one input parameter x, N being an integer greater than or equal to 1, first measured the physical quantity Pm1 for each of the N distinct parameter values x_i of the at least one input parameter x, while keeping all other input parameters fixed, constructed a Vandermonde matrix VM using the set of N parameter values x_i of the at least one input parameter x, and computed the model W for emulating the physical quantity P based on the Vandermonde matrix and the first measured physical quantity according to the equation W=(VMT*VM)?1*VMT*Pm1. The model is iteratively refined so as to obtained a desired emulation precision. The model can later be used to emulate the physical quantity based on input parameters or logs taken from the field and thereby support device design optimization.